| Customization: | Available |
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| After-sales Service: | Whole Life Technical Support |
| Application: | Electrical & Electronics |
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The JNYQ-0-15 Laser Process Gas Analysis System is based on the internationally advanced Semiconductor Laser Absorption Spectroscopy (TDLAS) technology, specifically the "Single Line Spectroscopy" measurement technique. The system uses a modulated semiconductor laser as the light source. By modulating the working current intensity of the semiconductor laser, the laser frequency is adjusted, causing the scanning range of the laser to be slightly larger than the single absorption line of the target gas.
As the laser beam with a specific wavelength emitted by the semiconductor laser passes through the measurement tube, it is selectively absorbed by the target gas according to its absorption spectrum, leading to a reduction in the laser intensity. The system leverages the fact that each gas has a unique absorption spectrum and that there is a relationship between gas concentration and infrared or laser absorption spectra governed by the Beer-Lambert Law. By detecting the degree of absorption (i.e., the attenuation of the laser intensity), the concentration of the target gas can be determined.
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